eComp offers comprehensive electrical test solutions for the aerospace, defense, electronics, medical, automotive and commercial industries from an ISO 9001:2008 certified facility.
Comprehensive Electrical Test Solutions
• All in-house test program development
– All EEE products
– Up to 12.2 Gbs Digital
– Jitter/noise at sub-psec level
• Product characterization over voltage and temperature
• RF testing
– Component level: +20 GHz
– Wafer level: up to 6 GHz
• Engineering support
– Device analysis
• Production testing
– Wafer sort –12”
– Final test –2000+ Pins
| Recent Products Supported (Electrical) | |
|---|---|
| Product Technologies | Key Software Development |
| Digital and Mixed Signal Devices – High End Devices | • 32bit and 16bit Microprocessors, Microcontroller and DSPs • Serial Communication Controllers • FPGAs • Greater than 1M Gate Counts•Embedded 32bit Processor Core • SerDes Implementation • High Frequency, High I/O CPLDS –10Gbs • VME Bus Interface • PCI Express • PCI/X-to-VME Bridge |
| Memory – All Major Memory Technologies | • 1Gb DDR3 SDRAM (667 Mhz) • 2Gb DDR2 SDRAM(800 Mhz) • 1Gbit Flash (120ns) • 512M DDR2 (400 Mhz) • 512M SDRAM • 18Mbit QDR (167 Mhz) • 576Mb RLDRAM (533 Mhz) • 32M PROMs (Flash) |
| Linear – Experience with All Linear Types | • 16bit, 32 Channel High Sampling DACs • 16bit ADCs • Triple 8-bit Video ADC • 10bit Video DACs |
| ASICs | • 5M to 25 Gate Counts |
| RF | • 20 GHz Transceivers • 10 GHz GaAs Low Noise Amplifier • 10 GHz Choke • 3.5 GHz Buffer Amplifier • 10+ GHz High Efficiency FETs • 1.6 GHz Frequency Synthesizer • 1.2 Gbs Digital Signal Processor |
| Discrete / Passive | • Digital / Bipolar / MOSFET Transistors • RF FETS • Fast Recovery Diodes • Power Schottky Diodes • Rectifiers (Bridge, Power, Fast Recovery, High Efficient) • Voltage Regulators (LDO, Linear, Step-Up) • High Voltage Capacitors (10,000V) |
| Other EEE Components | • Connectors • Crystals • Cables • Relays • Transformers |
Test Capabilities
| Digital, Mixed Signal & Analog | ||
|---|---|---|
| Test Systems | Tester Platform | Description |
| Verigy | 93K PinScale 93K PinScale 93K PinScale 93K SOC Port Scale |
Digital I/O 1024; 128 GBPS, MB AV8 Digital I/O 768; MB AV8 Digital I/O 576 Digital I/O 768; PS1000, HCDPS, 2 NP Cards Digital I/O 192; 24 RF Ports, MB AV8 |
| Credence | D-10 OCTET VALSTAR 2000 VALSTAR 2000 QUARTET QUARTET SC312 SC312 Fusion CX |
Digital I/O 576; Mixed Signal Digital I/O 896 Digital I/O 1024 Digital I/O 768 Digital I/O 448; Mixed Signal Digital I/O 512 Digital I/O 304 Digital I/O 256 Digital I/O 48; Mixed Signal / RF |
| Sentry | Sentry 21 | 21(2 systems); Up to 20MHz; Low voltage/High voltage Test heads; Up to 16 timing generators/ 156pS resolution; maximum current = +/-100mA; Resolution = +/-1 nA; pin electronics = +6V/-2V (high speed)/ +6/-22V (high voltage); Precision Measurement Unit = +/-100V |
| Sentry 7( | (2 systems); Up to 20MHz; Low voltage (High speed)/HV Test heads; Up to 16 timing generators/ 156pS resolution; maximum current = +/-100mA; Resolution = +/-1 nA; pin electronics = +6V/-2V (high speed)/ +6/-22V (high voltage); Precision Measurement Unit = +/-100V; Factor Programming Language |
|
| Discrete, Linear & Passive | |
|---|---|
| Test System | Tester Platform / Description |
| Discrete | Scientific Test 5300HX-L Automated Tester: Fully Automated; Programmable; 20 pA :Low Current Readings with 1 pA; 1000V and 100A Capability; High Speed Datalog; Handler Compatible
Lorlin Impact II; Menu Driven System (Computer Controlled); RLO1 Storage System 3 Test Heads; Current Maximum = 100 Amps; Voltage Maximum = 1200 Volts |
| Passive | Custom Set-up |
| Connectors | |
|---|---|
| Test Systems | Tester Platform / Description |
| Microscope | Visual Examinations per Specifications |
| Agilent E3614A orEquivalent | Shell-to-shell Conductivity; Specifically Designed Fixture per Connector Package (Mate Mounted) |
| HP 3478A | Shell-to-shell Conductivity; Specifically Designed Fixture per Connector Package (Mate Mounted) |
| Compliance WestHT-20KV Ac/Dc | Dielectric Withstanding Voltage; Specifically Designed Fixture for Individual Pin Measurements and Total Package Measurement |
| Chatillon Model #DPP-50 | Push/Pull Gage; Contact Retention |
| WagnerModel #FDK-80 | Force Cage; Contact Retention |
| MHH PrecisionTorque Wrench or Equivalent | Coupling Torque |
Capacitor Testing
Capacitance
• HP 4275A
Dissipation Factor
• HP 4275A
DC Leakage (DCL)
• Power Supply, Meters
IR (Leakage)
• General Radio –Model #1644
Surge Current
• Options A , B, or C per MIL-PRF-55365
ESL
• Resonant Coaxial (Booton Model 34A)
• Spectrum Analyzer HP 3585A
DWV
ESR
Call eComp today and let us help you with Comprehensive Electrical Test Solutions. Call us at 508-881-8399 or 1-877-463-2667 or email us now.
