eComp offers electronic component testing services for the aerospace, defense, electronics, medical, automotive and commercial industries from an ISO 9001:2008 certified facility.
Testing Services
Quality Compliance
- ISO 9001:2008
- MIL-I-45208
Equivalent Testing To
- MIL-M-38510
- MIL-PRF-38535
- MIL-PRF-19500
- MIL-STD-202
- MIL-STD-750
- MIL-STD-883
- MIL-STD-981
- MIL-HDBK-454
Electrical Testing/Burn-In
Extensive test program library with capabilities for AC, DC parametric and functional evaluation and testing of a wide variety of devices ranging from diodes and transistors to more complex linear, LSI, VLSI technologies, as well as complete bench test set-ups for non-standard parameters and passive components. Static/Dynamic Burn-In with positions are available for most package styles.
- Up Screening – Industrial Temperature
- Ac Parametrics
- Burn-In
- Life Testing
- Read & Record
- Go/No-Go
- Pre & Post Electrical
- Memory Testing
- Comparative Analysis
Environmental Testing
- Solderability/Tinning
- Stabilization Bake
- Humidity Testing
- Temperature Cycle
- Centrifuge
- Hermeticity (FINE/GROSS Leak)
- Particle Impact Noise Detection (PIND)
Custom Services
- Device Programming & Erasure
- Marking
- Bar Coding
- Dpa/Failure Analysis
- Selection Testing
- Engineering Evaluation
Facilities Listing
Tape and Reel & Dry Packaging
- Tape and Reel – Q-Corp QMT-1100D
- Counter – Q-Corp QC-100
- Vacuum Seal – Amerivacs AVS-20
- Dry Packaging
Memory Testing
- Darkhorse Systems Sigma II dc parametric performed of DRAM devices
- Darkhorse Systems Sigma LC functional testing of DRAM
Digital Testing
- Logue McDonald LMO500 – 384 I/O-100MHz
- Gen Rad 1732M Test Systems dc and parametric measurements
- Logue McDonald 324B-5 Test Systems – dc and parametric measurements along w/propagation delays
Linear Testing
- Analog Devices LTS2020
- Analog Devices LTS2010 – Parametric and functional testing capabilities for linear device such as: Op Amps, Comparators, Regulators, DAC’s and ADC’s
Discrete Testing
- Scientific Test 5150 Test Systems with High Voltage and High Current capability
- Scientific Test 5300 Test Systems with Low Current capability and multiple section DUT scanner deck – ability to record pre and post burn-in measurements – deltas calculated
Relay Testing
- Markenrich RT160 Relay Tester
Crystal Testing
- Saunders & Associates 250A Crystal Test System
Passive Testing
- Gen Rad 1689 RLC Digibridge Test System
- Gen Rad 1687 BLC Digibridge Test System
- Gen Rad 1684 Megohmmeter
Programming
- Digital I/O Unisite Systems – Variety of fixtures for a large assortment of devices
- Data I/O PSX1000 Parallel Programmer-capabilities to program up to 10 devices at a time
- BP Micro BP1400/84
UV Erasure
- UVEProm Erasing Cabinet
Labeling
- Brady Printer TMT 200M assortment of labels for all types of packages – kapton labels for high temperature applications
Temperature Testing
- Temptronics TP04000 Series Thermostream -65C to 200C
- Thermonics T2420SX-7 Temperature Forcing Systems capability of device environment of -65C to 200C
- Thermonics T-2820 Precision Temperature Forcing System -65C to 200C
Burn-In Capabilities
- Liner
- Digital
- Discrete
- Despatch PBC2-16
- Blue M
- Capability to perform static on a variety of packages from standard diodes to complex BGA. Dynamic performed at customer request
Temperature Cycling Air To Air
- Blue M WSP 109B3X16 capable of automatic transfer to satisfy MIL-STD-883 Method 1010 and MIL-STD-750 Method 1051
Gross Leak Testing
- Trio-Tech 481 Test Systems
Particle Impact Noise Detection (PIND)
- Dunegan/Endevco 4501A capability to satisfy MIL-STD-883 Method 2020 and MIL-STD-750 Method 2052
Call eComp today and let us show you our Electronic Component Testing Services and our Commitment to Quality! Call us at 508-881-8399 or 1-877-463-2667 or email us now.
