eComp, Electronic Components, Inc

Electronic Component Testing, Counterfeit Mitigation & Authentication and Component Engineering

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You are here: Home / Electronic Component Testing Services

Electronic Component Testing Services

eComp offers electronic component testing services for the aerospace, defense, electronics, medical, automotive and commercial industries from an ISO 9001:2015 certified facility.

NSAI Certified

Electronic Component Testing Services

Quality Compliance

  • ISO 9001:2015
  • AS9120B
  • MIL-I-45208

Electronic Component Testing Services
Equivalent Testing To:

  • MIL-M-38510
  • MIL-PRF-38535
  • MIL-PRF-19500
  • MIL-STD-202
  • MIL-STD-750
  • MIL-STD-883
  • MIL-STD-981
  • MIL-HDBK-454

Electrical Testing/Burn-In
Extensive test program library with capabilities for AC, DC parametric and functional evaluation and testing of a wide variety of devices ranging from diodes and transistors to more complex linear, LSI, VLSI technologies, as well as complete bench test set-ups for non-standard parameters and passive components. Static/Dynamic Burn-In with positions are available for most package styles.

  • Up Screening – Industrial Temperature
  • Ac Parametrics
  • Burn-In
  • Life Testing
  • Read & Record
  • Go/No-Go
  • Pre & Post Electrical
  • Memory Testing
  • Comparative Analysis

Environmental Testing

  • Solderability/Tinning
  • Stabilization Bake
  • Humidity Testing
  • Temperature Cycle
  • Centrifuge
  • Hermeticity (FINE/GROSS Leak)
  • Particle Impact Noise Detection (PIND)

Custom Services

  • Device Programming & Erasure
  • Marking
  • Bar Coding
  • Dpa/Failure Analysis
  • Selection Testing
  • Engineering Evaluation

Facilities Listing

Tape and Reel & Dry Packaging

  • Tape and Reel – Q-Corp QMT-1100D
  • Counter – Q-Corp QC-100
  • Vacuum Seal – Amerivacs AVS-20
  • Dry Packaging

Memory Testing

  • Darkhorse Systems Sigma II dc parametric performed of DRAM devices
  • Darkhorse Systems Sigma LC functional testing of DRAM

Digital Testing

  • Logue McDonald LMO500 – 384 I/O-100MHz
  • Gen Rad 1732M Test Systems dc and parametric measurements
  • Logue McDonald 324B-5 Test Systems – dc and parametric measurements along w/propagation delays

Linear Testing

  • Analog Devices LTS2020
  • Analog Devices LTS2010 – Parametric and functional testing capabilities for linear device such as: Op Amps, Comparators, Regulators, DAC’s and ADC’s

Discrete Testing

  • Scientific Test 5150 Test Systems with High Voltage and High Current capability
  • Scientific Test 5300 Test Systems with Low Current capability and multiple section DUT scanner deck – ability to record pre and post burn-in measurements – deltas calculated

Relay Testing

  • Markenrich RT160 Relay Tester

Crystal Testing

  • Saunders & Associates 250A Crystal Test System

Passive Testing

  • Gen Rad 1689 RLC Digibridge Test System
  • Gen Rad 1687 BLC Digibridge Test System
  • Gen Rad 1684 Megohmmeter

Programming

  • Digital I/O Unisite Systems – Variety of fixtures for a large assortment of devices
  • Data I/O PSX1000 Parallel Programmer-capabilities to program up to 10 devices at a time
  • BP Micro BP1400/84

UV Erasure

  • UVEProm Erasing Cabinet

Labeling

  • Brady Printer TMT 200M assortment of labels for all types of packages – kapton labels for high temperature applications

Temperature Testing

  • Temptronics TP04000 Series Thermostream -65C to 200C
  • Thermonics T2420SX-7 Temperature Forcing Systems capability of device environment of -65C to 200C
  • Thermonics T-2820 Precision Temperature Forcing System -65C to 200C

Burn-In Capabilities

  • Linear
  • Digital
  • Discrete
  • Despatch PBC2-16
  • Blue M
  • Capability to perform static on a variety of packages from standard diodes to complex BGA. Dynamic performed at customer request

Temperature Cycling Air To Air

  • Blue M WSP 109B3X16 capable of automatic transfer to satisfy MIL-STD-883 Method 1010 and MIL-STD-750 Method 1051

Gross Leak Testing

  • Trio-Tech 481 Test Systems

Particle Impact Noise Detection (PIND)

  • Dunegan/Endevco 4501A capability to satisfy MIL-STD-883 Method 2020 and MIL-STD-750 Method 2052

Call eComp today and let us show you our Electronic Component Testing Services and our Commitment to Quality! Call us at 508-881-8399 or 1-877-463-2667 or email us now.

eComp Services

  • Component Engineering Services & Electronic Component Testing
  • Electronic Component Services
  • Component Engineering
  • Counterfeit Mitigation
    • Counterfeit Detection: Mitigate Risk with our Custom Kit
  • DNA Marking – Electronic Components
    • Creating SigNature DNA
    • Independent Assessment and Testing
    • Counterfeit Prevention Authentication Program
    • DLA – Anti-Counterfeit Solutions
  • Electronic Component Testing Services
  • Obsolescence Management / Environmental Compliance

Contact Us

    Company Profile

    eComp is a specialty distributor and authenticator of products for the military, aerospace, medical and industrial marketplace. We provide authenticity verification / value added services for legacy components and can offer engineering assistance and custom replacement solutions for obsolete products and systems.

    Terms and Conditions of Sale
    Terms and Conditions for Suppliers

    News

    eComp is now offering a Counterfeit Detection Kit. It provides some of the basic tools used for counterfeit semi-conductor detection, eComp’s CDK-1 Kit enables a basic, in-house check before formal testing. Click here to find out more.

    Click here for the latest news.

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    Contact

    eComp
    Electronic Components, Inc.

    39 Loring Dr
    Framingham, MA 01702

    Toll-Free 1-877-463-2667
    Tel: 508-881-8399
    Fax: 508-861-0113

    Click here to email us.

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